Tester checks memories at rated speed
Tester is a fully programmable tester for the functional, as well as
parametric, testing of DRAM, SRAM. Video RAM and SIMM devices up to 18
bits wide and 64 Mbytes in size. The tester can automatically measure the
access time of these devices over a range from 2 to 150 ns with 1-ns
resolution. Timing tests are fully programmable to allow testing DRAMs at
their specified operating speeds. Using a programmable dynamic loading
feature allows the user to program the DUT output loading across a wide
range of operating conditions, which can be critical with SIMM devices
because they must often drive large capacitive loads. The 6500 is equipped
with a RS-232 interface and an automatic handler interface that has a bin
sort feature that allows it to sort devices based on the value of a
selected device operating parameter for go/no go production testing. Up to
100 different user-defined test routines can be stored. A standalone
instrument, the 6500 requires no additional software or specialized
training for use. It is designed so that only one test module is required
for each major device type such a DRAM or SRAM. (Mainframe, $4,900; Test
Module, $995 to $1,900 ea–4 weeks ARO.) Information Scan Technology
Santa Clara, CA David DeLeonardo 408-988-1908
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