End-to-end tester accelerates LTE, WiMAX development

End-to-end tester accelerates LTE, WiMAX development

Lets designers of handsets, RF chips, and baseband ICs emulate and analyze designs early and fast

The Radio Digital Cross-Domain (RDX) test system is said to be the first end-to-end tester for design of wireless handsets, RF ICs, and baseband ICs based on the latest MIPI (Mobile Industry Processor Interface) Alliance digital RF specifications (DigRF V4). The system gives engineers working on LTE- and WiMAX-compatible designs a comprehensive tool for stimulating and analyzing their projects.

Also able to support V3 specs, the “cross-domain” tester lets its users choose the domain (digital or RF) and abstraction level (physical or protocol layer) in which they want to work so they can quickly characterize devices and solve cross-domain integration problems. Built with a modular structure to accommodate future MIMO designs, test systems consists of N5343A exerciser modules and N5344A analysis modules housed in one or more N2X mainframes.

E5345A and E5346A active probes provide capacitive loading of less than 0.15 pF, as well as high sensitivity, so that measurements don’t affect device-under-test performance. Design engineers can also choose N5345A Midbus Probe with Soft Touch for probing prototype boards or B5346A flying leads for space-constrained designs.

The test software environment includes protocol generation and analysis, and works with Signal Studio and 89600 vector signal analysis software. (Modules, from $15,000; probes, from $22,000 available December.)

Agilent Technologies , Santa Clara , CA
Sales 800-829-4444
http://www.agilent.com/find/digrf