Characterization tester checks solar cells, LCDs, OLEDs
Hardware, firmware, and software enhancements to the Model 4200-SCS semiconductor characterization system, the KTEI V7.2 upgrade includes nine new test libraries and an expanded frequency range for capacitance-voltage (C-V) measurement. Not only does the upgrade turn the system into the first turnkey tester for solar-cell material and device characterization, but it also provide support for testing the latest flat-panel LCDs and organic semiconductors such as OLEDs.
The libraries simplify I-V, C-V, and resistivity testing of solar-cell materials to speed development of alternative-energy technologies. The software also supports a solar-cell test technique called drive-level capacitance profiling (DLCP). The technique, which was previously difficult to perform accurately, provides defect density information on thin-film solar cells.
A firmware-only upgrade extends the tester range down to 1 kHz from the previous 10 kHz, providing a range of 1 kHz to 10 MHz that not only supports DLCP testing but also proves useful for defect detection in LCDs and organic semiconductors. Also being introduced is a chassis with a ninth slot (existing eight-slot chassis can be upgraded) to eliminate the need for external instruments. (KTEI V7.2, free to existing users; charge for recalibration and slot upgrade available now.)
Keithley Instruments , Cleveland , OH
Information 800-688-9951
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