ITC 2010 Paper Deadline Approaching

International Test Conference Nov 2 – Nov 4, 2010 Austin Convention Center

Test Week : Oct 31 – Nov 5, 2010 Austin, Texas

The March 17 deadline for submitting paper proposals is rapidly approaching. View the Call-for-Papers on the ITC Web site for full details.

ITC is the industry's premier conference dedicated to the electronic test of semiconductors, boards, and systems. A wide range of events including: paper sessions, tutorials, panels, advanced industrial practice presentations, a lecture series, a poster session, workshops, exhibits, and a host of networking and social opportunities await you. You are encouraged to actively participate by submitting a paper. Following is a list of Conference Focus Topics. Additional topics are listed in the Call-for-Papers announcement on the ITC website.

Conference Focus Topics:

• Design-for-Manufacturability

• Yield Analysis and Optimization

• Embedded Instruments (BIST, DFT)

• Design-for-Reliability and Reliability Screening

• Low-Cost Test

• Standalone Memory Test and Repair (DRAM, Flash, Emerging)

• Emerging Test Problems (Display, 3D, MEMS, Imaging Sensors)

• Load boards and Probe-cards

• System Test in Application Environment

• Fault Modeling of New Defects

• Design, Test, and Yield for 45 nm and Beyond

• Test Optimization Across Supply-chains

• Experiments and Case Studies

• Diagnosis and Silicon Debug

• Automatic Test Equipment

Presenting a paper at ITC provides peer recognition and an opportunity to win the ITC Ned Kornfeld Best Paper Award, which includes a cash prize. The latest winners of the award from Advanced Micro Devices were recognized at the ITC 2009 plenary session by the General Chair Gordon Roberts. Their paper from ITC2008 was titled “Test Access Mechanism for Multiple Identical Cores.”

The Test Week advance program and registration information will be available in July. Visit www.itctestweek.org often to get the latest event information.