Source-meter unit brings 5X more power to semi test
Optimized for testing high power devices such as diodes, FETs, and IGBTs, as well as characterizing newer semiconductor materials such GaN and SiC, the Model 2657A High Power System SourceMeter instrument (SMU) lets users characterize devices and materials with a built-in 3,000-V, 180-W source, thus delivering up to five times more power than the nearest competitive system. Not only does it do this at a significantly lower cost, but the SMU can also resolve 1 fA with its high-speed 6-1/2-digit measurement engine, even when sourcing up to 3,000 V, thus supporting low-leakage tests for next-generation power semiconductors.
The instrument lets users choose either of two measurement modes — integrating or digitizing — for characterizing both steady-state and transient behavior, including rapidly changing thermal effects. Each mode uses two independent ADCs — one for current and the other for voltage — that run simultaneously: so users can capture voltage and current transients, the digitizing mode uses two 18-bit converters capable of fast, 1-point/μs sampling, while the integrating measurement mode employs dual 22-bit ADCs for precise measurement of very low currents and ultra high voltages.
Included in the hardware is TSP Express, an LXI-based I-V test software utility that lets users perform basic device characterization without programming or installing software — users simply connect a PC to the instrument’s LAN port and access the built-in software with any Java-enabled Web browser. For more advanced operation, two additional software tools are provided: Test Script Builder for creating and running TSP scripts, and an IVI-based LabVIEW driver.
As an option, ACS Basic Edition software is available to provide even more features for characterizing high-voltage/current components. Its measurement libraries support both dc and pulse-mode operation as well as a variety of power devices — FETs, BJTs, diodes, IGBTs, and others — with tests that include input, output, and transfer characteristics on most devices. Its Trace mode gives real-time control over voltage or current output using a simple slider.
And while the 2657A can be connected to other instruments in a test system with standard safe-high-voltage (SHV) coax connections, special HV triaxial (guarded) connections are offered to optimize measurement accuracy. Further, the optional Model 8010 High Power Device Test Fixture, which has rear-panel scope and thermal-probe ports, makes it safer and simpler to configure a system for testing packaged high power devices up to 3,000 V or 100 A, (2657A, from $17,900; ACS Basic Edition; $5,000; Model 8010 fixture, $6,500 — available 2 weeks ARO starting in May.)
By Richard Comerford
Keithley Instruments , Cleveland , OH
Information 440-248-0400
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