Creating Scaleable, Multipin, Multi- Function IC Test Systems

Creating Scaleable, Multipin, Multi- Function IC Test Systems

As the complexity of the device under test (DUT) grows, so does the amount and sophistication of testing it requires. This application note shows how SMU instruments address many of the requirements of complex multipin, multifunction IC testing using a digital-to-analog converter (DAC) test as a practical example. ■