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Evolving Semiconductor Characterization and Parametric Test Solutions for the Evolving Semiconductor Industry

Evolving Semiconductor Characterization and Parametric Test Solutions for the Evolving Semiconductor Industry

Evolving Semiconductor Characterization and Parametric Test Solutions for the Evolving Semiconductor Industry

This white paper outlines recent trends and emerging market forces in the semiconductor industry, including the growing demand for non-volatile memory, the need for additional testing and analysis, device reliability phenomena associated with continued CMOS scaling, the burgeoning demand for power conversion/efficiency devices, and the differing test needs of new semiconductor materials. The white paper also outlines Keithley’s approach to providing scalable, flexible solutions that adapt readily to the expanding range of semiconductor technologies, companies, and applications.■

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