Labs’ Demands for Greater Measurement Flexibility Require Cabling Systems Capable of Accommodating Multiple Me

Labs’ Demands for Greater Measurement Flexibility Require Cabling Systems Capable of Accommodating Multiple Measurement Types

Understanding a semiconductor device’s electrical characteristics and the processes used to manufacture it requires a diverse array of measurements. I-V, C-V, and pulse-based measurements are the most common measurements made. All three of these measurement types are included as capabilities of leading semiconductor device characterizers. These characterizers strive to integrate these measurements in order to reduce the time and effort required to make these measures. One of the most difficult problems associated with integrating these measurements is that the cabling required for each measurement type is fundamentally different. Although the cabling from the instrument to the probe station bulkhead and feed through is fairly straightforward, the cabling from the bulkhead to the probe tips can be confusing and difficult. This white paper explains the different cabling requirements and describes a single multi-measurement cabling system that offers high performance and is easy to use. ■