The following research paper was discussed at the IEEE Workshop on Accelerated Stress Testing and Reliability.
The paper discusses:
– Failures of tantalum capacitors as time dependent dielectric breakdown (TDDB).
– Justification for Weibull Grading Test (WGT).
– Errors associated with WGT.
– Results of highly accelerated life testing (HALT).
– Results of life step stress testing (LSST).
– Voltage acceleration factors.
– Voltage derating as a means to increase reliability of tantalum capacitors.
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