Agilent Technologies, Maury Microwave Host Amplifier Design Flow– From Component to Circuit to System Measurement & Modeling Seminar

What: Device characterization is an essential process in many aspects of research, development and testing of RF and microwave devices. In this seminar attendees will explore various interconnected topics of device characterization that form the amplifier design flow.

Topics include: 
• Pulsed IV and S-parameters for compact model extraction
• Load pull for model validation and measurement
• Amplifier design and IC stability analysis
• X-parameter modeling and system-level simulations 

When: Dec. 5, 2013 
 
Where: Maury Microwave, Ontario, CA, registration required.
 
Additional
Information: www.agilent.com/find/eesof