The Heat is On When You Test @ 125degC – A Coto Technology One Pager

Regarding Coto's wide operating temperature line of PICO and SMD reed relays for high temperature DUT applications

Many integrated circuits used in high stress environments (for example, automobile under-hood) must be qualified at high temperatures to ensure they meet their design specifications. Automated Test Equipment (ATE) system designers face the challenge of how to stress the device under test (DUT) during design or production test. Traditionally, the interface between the ATE system and the DUT has been a load board, which is a printed circuit board fitted with a test socket for the DUT and switchable signal traces leading to it. Test signals are switched to and from the various DUT pins using relays under program control from the ATE.