High-speed CMOS op amps boost EMI immunity

Rohm Semiconductor has expanded its EMARMOUR product line with the new BD8758xY series (BD87581YG-C and BD87582YFVM-C) of rail-to-rail input/output high-speed CMOS operational amplifiers. The op amps feature improved EMI immunity for automotive and industrial equipment applications that require high-speed sensing in harsh environments, such as vehicle engine control units and anomaly detection systems for factory automation equipment.

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Rohm said the  EMARMOUR Series, introduced in 2017, offers “superior noise immunity that reduces design resources by combining a vertically integrated production system with proprietary analog design technology,” and “prevents malfunctions due to noise without the need to take special application measures.” This series is particularly suited to electrification and mounting density trends that have increased environmental noise in electric vehicles (EVs) and cars with advanced driver assistance systems (ADAS).

The BD8758xY series has demonstrated superior performance under four international noise evaluation tests, according to Rohm. One example cited is the ISO 11452-2 radio wave emission testing conducted by vehicle manufacturers, in which the output voltage of standard products fluctuates by more than ±300 mV in all frequency bands, compared to ±10 mV or less for the BD8758xY series.

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The CMOS element structure enables high-speed signal amplification without being affected by external noise when installed inside the targeted sensor applications, which improves reliability and reduces design production hours in a range of applications, said Rohm. These include industrial factory automation equipment, measurement equipment, measuring instruments, servo systems, and sensor systems as well as EV/HEV inverters, engine control units, eCall, and car navigation/air conditioning systems.

The BD8758xY series is available from online distributors: Digi-Key, Mouser, Farnell. In addition, Rohm offers the ROHM Real Model, a new high accuracy SPICE model that matches the electrical and temperature characteristics of the actual IC and simulation values to prevent rework after prototyping.