WHAT IS THE WEBCAST ABOUT?
The performance of modern test instrumentation is excellent, but a user of these instruments expects to establish this level of performance, particularly the accuracy, not only at the test ports of the instrument, but at the test ports of the DUT. This has always been a difficult problem to solve, and with the push to higher frequencies of operation, increased number of test ports, and more common use of “non-standardized” interfaces, both the technical challenge and the importance of an effective methodology are intensifying.ATE Systems has developed a number of approaches to fixture characterization to accomplish the objective of accurately measuring devices with multiple microstrip, CPW, SMT, BGA, OSP, GP(n)O, and other RF interfaces for which there are no associated calibration kits. Of course the design of the test fixture is critical since it must support the intended characterization methodology in addition to satisfying other requirements for the DUT such as the RF interface, biasing and control, mechanical and thermal, and possibly others.
Presented by:
Peter Phillips
VP Engineering,
ATE Systems
WHO SHOULD VIEW THIS WEBCAST?
Engineers involved in RF, microwave, or high-speed interconnect circuit, IC package, or PCB design or testing; test lab managers and test engineers in engineering, design verification, or manufacturing test areas.
Register here.
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