NXP has unveiled a new analog front-end family (N-AFE) that brings higher precision data acquisition and condition monitoring to factory automation. According to NXP, the new N-AFE family enables the software-defined factory, making it easier to configure a smart factory and adjust settings based on evolving market conditions.
The addition the N-AFE family of devices delivers new analog capabilities to NXP’s industrial applications portfolio. (Source: NXP Semiconductors)
Key features of the new family include software configurable voltage, current or temperature modes with up to eight software-configurable universal analog input channels, built-in self-test to predict faults and avoid catastrophic failure, and self-calibration. It also offers a 2× system accuracy improvement and 2× faster data acquisition.
The NAFE11388 is designed for programmable logic controllers (PLC), I/O modules, data loggers, instrumentation, and high precision sensor and data acquisition systems. It integrates low-leakage high-voltage fast multiplexers, low offset and low drift PGA and buffers, a precision and high data-rate 24-bit delta-sigma ADC, and a low-drift voltage reference. Analog high voltage (HV) input pins are diode-protected internally for EMC and miswiring scenarios.
The NAFE71388 is a highly configurable industrial-grade multi-channel universal input analog front-end (AFE) that meets high-precision measurement requirements. The NAFE71388 is equipped with various diagnostics and supplies supervisory circuitry for condition monitoring and anomaly detection. Two precise calibration voltage sources are made available for ease of end-to-end system self-calibration and predictive maintenance.
NXP is exhibiting at electronica, Nov. 15-18, Munich, Germany, at booth #C2 578.
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