Stable blue phosphor enables EL display breakthrough
Stable blue phosphor enables EL display breakthrough By overcoming a significant fabrication obstacle, Westaim Advanced Display Technologies (Fort Saskatchewan, Alberta,
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Floating-point DSP extends fixed-point architecture
Floating-point DSP extends fixed-point architecture Texas Instruments (Dallas, TX ) plans a 32-bit floating-point DSP family that replicates the architecture of its
Diode packages squeeze more power into tight spaces
Diode packages squeeze more power into tight spaces Two recently announced rectifier packages offer designers improved power handling for space-sensitive applications.
CMOS fingerprint sensors make PIN codes obsolete
CMOS fingerprint sensors make PIN codes obsolete Solid-state devices make biometric-access control feasible for many personal and multiple-user devices Recent CMOS
PowerPC architecture gains vector-processing capability
PowerPC architecture gains vector-processing capability Motorola Semiconductor (Phoenix, AZ) plans to extend the PowerPC architecture with a vector-processing
Ultrasonic crimping process eases mass cable termination
Ultrasonic crimping process eases mass cable termination Sonic Connections (Walpole, MA) has developed a cable termination technology that uses ultrasonic energy in
Wireless PC Card breaks 10-Mbit barrier
Wireless PC Card breaks 10-Mbit barrier In response to the ever-increasing demand for higher data rates over wireless LANs, Aironet Wireless Communications (Fairlawn,
Benchtop and high-voltage power supplies
Benchtop and high-voltage power supplies Here is a roundup of recently introduced benchtop and high-voltage power supplies BY SPENCER CHIN Associate Editor Today's
Networked test equipment simplifies documentation
Networked test equipment simplifies documentation A LAN port on a test instrument allows the instrument to access and use all network resources BY DAVID LONGContinue
New test instruments speed telecommunications tests
New test instruments speed telecommunications tests However, faster test instruments are not the only solution for improving test cycle time BY ROBERT GREEN Keithley