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IP ’97 ponders future of design reuse

IP '97 ponders future of design reuse The Intellectual Property in Electronics Conference (IP '97) will offer designers and industry executives an opportunity to

BIST tool tackles high-speed testing

BIST tool tackles high-speed testing Software enables verification at 100 MHz and beyond An integrated suite of BIST design objects and automation software addresses

High-end power monitors go digital

High-end power monitors go digital In the age of the microprocessor, power monitors for military and industrial systems have remained bulky, analog-based instruments

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