IC memory system aids fault isolation, repair

IC memory system aids fault isolation, repair

The Self-Test and Repair (STAR) Memory System enables automated test vector generation, silicon debug, and fault isolation and classification in IC memory designs. Version 4.0 of the memory test-and-repair subsystem is a completely open RTL package that can be used with Virage Logic, other third-party, or internally developed embedded memories.

The STAR system provides test/repair solutions that enable designers to quickly ramp their designs to volume manufacturing at advanced nodes and includes hierarchical insertion and verification of a test and repair subsystem. (From $25,000, project license basis — available now.)

Virage Logic , Fremont , CA
Sales 510-360-8000

http://www.viragelogic.com