Increasing Production Throughput of Multi-pin Devices

Increasing Production Throughput of Multi-pin Devices

This application note explores the advantages of using Keithley’s System SourceMeter instruments in production environments to enhance test performance and throughput. Specifically, it discusses how to implement and optimize the embedded Test Script Processor (TSP) and on-the-fly pass/fail capabilities of these instruments to decrease the communications time and increase throughput. It includes a step-by-step illustration of a real-world example—production testing a BJT device. ■