Low Current SMU Models Open The Door To More Semi Applications And Lower Cost Of Testing

Low Current SMU Models Open The Door To More Semi Applications And Lower Cost Of Testing

Researchers and manufacturing managers are continually looking for ways to improve testing by increasing throughput and measurement integrity. This is particularly true in semiconductor and other component testing. While large mainframe test systems can be customized for these purposes, their cost is often prohibitive. So, there is an acute need for an instrument architecture that allows easy, low-cost customization and expandability without a cumbersome mainframe. This white paper describes SMUs designed to extend source-measure resolution down to the one femtoamp level, allowing for accurate high-speed measurements of leakage and quiescent currents, plus other critical and sensitive I-V characterizations. ■