Measurement system captures flicker noise accurately
Tester is certified for measurements crucial to shrinking devices and operating voltages
Certified to provide accurate measurements from 1 Hz to 30 MHz, the EDGE flicker noise measurement system is a fully integrated turn-key solution, unlike traditional flicker noise measurement solutions, which are bolted together from multiple systems and often introduce such noise into measurements. The ability to accurately characterize the flicker, or 1/f, noise — which occurs in all semiconductors and can cause errors in communications devices, flash memory, and SRAM — is key to shrinking operating voltages and device geometries.
The system seamlessly integrates a wafer probe station, instruments, software and accessories. As a result, its background noise is typically less than 1.2 nV/√Hz at 100 kHz and above. The system can also switch between flicker and dc measurements with push-button automation, providing both sets of measurements, over-temperature, in one system and eliminating the need to transfer wafers between stations or reconfigure a station.
The tester comes with an extremely high level of service and support. Pre- and post-sale support includes device and lab site evaluation, pre- and post-sale training, and 100 hours of ongoing application and technical support. ($1.2 million — available now.)
Cascade Microtech , Beaverton , OR
Cali Sartor 503-601-1000
Advertisement
Learn more about Cascade Microtech
