The Self-Test and Repair (STAR) Memory System is a solution for embedding on-chip memory test and repair in designs. It targets advanced process nodes of 90 nm and below with a unique, automated approach that can significantly improve yields and greatly reduce time to market.
The system also addresses process challenges with STAR Yield Accelerator, which bridges the design and manufacturing disciplines to enable automated test vector generation, silicon analysis, and fault isolation and classification used at tape-out, bring-up, and volume manufacturing stages. The system is open, enabling licensees to use its capabilities with other commercially available and internally developed embedded memories. (Project-based pricing, from $25,000—available now.)
Virage Logic , Fremont , CA
Sales 510-360-8000
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