Optimizing Low Current Measurements

Many critical applications demand the ability to measure very low currents—such as picoamps or less. These applications include determining the gate leakage current of FETs, testing sensitive nano-electronic devices, and measuring leakage current of insulators and capacitors. The Model 4200-SCS Semiconductor Characterization System, when configured with the optional Model 4200-PA Remote Preamp, offers exceptional low current measurement capability with a resolution of 1E–16A. This application note describes Keithley’s best-known methods recommendations for optimizing low current measurements using the Model 4200-SCS. ■