Parametric tester meets RF, flash challenges

Parametric tester meets RF, flash challenges

For current and next-gen IC process, tester makes advanced measurements in labs and on production floors

Designed to meet the measurement requirements of mainstream IC processes as well as those beyond 45 nm, the 4080 Series parametric test platform solves challenges posed by flash memory, in particular NAND-type, in production and the research lab. It expands test capabilities beyond pure dc measurement by adding capabilities such as parallel test, flash cell write/erase testing, and RF S-parameter characterization.

The test system comes in three configurations—the general-purpose 4082A, the 4082F for flash-memory cell testing, and the dc/RF 4083A—but its modular design allows addition of test capabilities like NAND/NOR flash memory cell characterization or RF S-parameter measurement in the field. With a faster CPU than previous testers, the system improves throughput by up to 20% on average without test-program modification.

The tester supports not only synchronous parallel test, but also an advanced parallel test capability called “asynchronous parallel” that uses a proprietary technology called virtual multiple test head. By performing tests completely independently in parallel, the system can decrease test times up to 50% over conventional, sequential-test methods.

The 4082F includes a semiconductor pulse generator unit (SPGU) mainframe and a high-voltage (80 Vp-p) SPGU (HV-SPGU) module that can control pulse rise and fall times down to 20 ns. The 4083A has a 20-GHz 8 x 10 matrix integrated into the test head and can measure up to five RF structures in a single probe touchdown.

All three models support two types of dc switching matrix cards—standard and ultra low-current versions—and feature a high-speed capacitance measurement unit for making fast measurements in the 1-kHz to 2-MHz range. (From $200,000—contact company for delivery time.)

Agilent Technologies , Santa Clara , CA
Sales 800-829-4444
http://www.agilent.com/see/4080