Predicting LCD TV warranty failure rates by using production yield data

The following research paper was discussed at the IEEE Workshop on Accelerated Stress Testing and Reliability.

As products are produced and Alternate Components introduced, effect on Volume Production Field Return Rate is critical. It is not feasible to continue with High Volume ALT or ORT throughout the product life, hence range of issues can be easily missed. This paper discusses a model to predict expected Field Return Rate from Process data provides an excellent ‘No-Cost’ opportunity to manage outgoing reliability.