To support the time-division-duplex (TDD) mode of 3GPP Long Term Evolution (LTE), the LTE TDD Measurement Suite (3030 option 108) for PXI 3000 Series modular instruments provides device manufacturers with advanced test capability to rapidly characterize the performance of LTE TDD chipsets, handsets, and terminal devices. The combination of the new software and the LTE frequency-division-duplex (FDD) measurement suite permits comprehensive RF parametric testing.
The LTE TDD software supports all uplink and downlink configurations including the special subframe configuration of 3GPP 36.211 section 4.2. LTE analysis is supported for uplink (SC-FDMA) transmissions for all 1.4 to 20-MHz bandwidths and modulation types QPSK, QAM16 and QAM64. In addition to numerical measurement results, the suite provides trace displays for spectrum emission mask, CCDF, constellation plots, EVM vs. carrier, and EVM vs. symbol. EVM analysis for uplink signals is supported for PUSCH, SRS, and PUCCH. (Contact sales for pricing and availability.)
Aeroflex , Plainview , NY
Sales 800-835-2352
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