SW targets structural, functional test

The ScanExpress boundary-scan tool suite version 7.8 includes improved cluster testing support, intelligent BSDL file handling, and a model-based test coverage. The suite also expands JTAG Embedded Test (JET) support to the Texas Instruments AM335x Sitara processors.

The boundary-scan tools feature a model based test coverage that limits test vector generation to nets where all nodes have been identified with a device model. The cluster definitions are assignable by pin numbers in addition to the net name. The TPG parsing engine automatically ignores leading “P” values found in pin definitions for non-BGA type BSDL files. Floating network licenses are supported under Linux. Current customers that have a valid maintenance contract can now access the new version through the company support website.