Four-Probe Resistivity and Hall Voltage Measurements Semiconductor material research and device testing often involve determining the resistivity and Hall mobility of a sample. The resistivity . .
Improving Low Current Measurements on Nanoelectronic and Molecular Electronic Devices I-V characterization of nanoelectronic and moletronic devices requires low level current measurements in the nanoamp to femtoamp range. To . .
High Throughput DC Production Testing of Laser Diode Modules and VCSELs Laser diodes (LDs) and VCSELs (Vertical Cavity Surface Emitting Lasers) are the primary components used in optical communications, spectroscopy, . .
Measuring Power regulated by Zero Crossing SCR Controllers A zero crossing SCR controller is used to regulate the power delivered to a resistive load. The controller uses . .
Heat Versus Ultrasonic Installation The focus of this article is on two of the most commonly used Insert installation methods in thermoplastic parts: . .
The PI33XX: Zero-Voltage Switching Applied to Buck Regulation The Picor PI33XX Cool-Power® ZVS Buck Regulator Series delivers maximum power density and high efficiency point of load DC-DC . .
Virtualization is Coming to a Platform Near You Virtualization in the PC and server markets has provided measurable benefits over the last few decades with advanced virtualized . .
Benefits of an Oscilloscope’s Digital Trigger The trigger is a key element of an oscilloscope. It captures specific signal events for detailed analysis and provides . .
Considerations for Selecting a Power Amplifier This white paper is intended to help individuals who are not power amplifier experts understand the basic parameters necessary . .
Creating Scaleable, Multipin, Multi- Function IC Test Systems As the complexity of the device under test (DUT) grows, so does the amount and sophistication of testing it . .