Ultra-fast CV module puts essential IC characterization abilities in one system

Ultra-fast CV module puts essential IC characterization abilities in one system

Designed to take up as many as four of the Model 4200-SCS semiconductor characterization system’s nine slots, the Model 4225-PMU I-V module integrates ultrafast voltage waveform generation and current/voltage measurement capabilities into the system so as to provide the industry’s broadest dynamic range of voltage, current, and rise/fall/pulse times, and thereby expand significantly the system’s ability to characterize materials, devices, and processes. Further, making the ultrafast measurements is as easy as making dc ones.

With the new module, a single system can provide the wide programmable sourcing and measurement ranges, pulse widths, and rise times needed for applications from nanometer CMOS to flash memory, which demand both ultrafast voltage outputs and synchronized measurement. Previous solutions have required up to three different test stands to perform the same tasks.

Each single-slot 4225-PMU module provides two channels of integrated sourcing and measurement. Pulse widths for each channel as small as 60 ns can be provided and simultaneous current and voltage measurement can be taken at rates up to 200 Msamples/s. Users can choose from ±10- or ±40-V source ranges (into 1 MΩ) and current measurement ranges of 800, 200, 10 mA, or 100 μA. Each module can be equipped with up to two optional Model 4225-RPM remote amplifier/switches, which provide four additional low-current ranges, reduce cable capacitance effects, and support automatic switching between the Model 4225-PMU and other modules in the chassis. (4225-PMU, $19,000; typical configuration with one 4225-PMU and two 4225-RPMs, $25,000 — available May.)

Keithley Instruments , Cleveland , OH
Information 800-688-9951

http://www.keithley.com