Voltage acceleration factors for infant mortality failures and derating of solid tantalum capacitors

The following research paper was discussed at the IEEE Workshop on Accelerated Stress Testing and Reliability.

The paper discusses:
–  Failures of tantalum capacitors as time dependent dielectric breakdown (TDDB).
–  Justification for Weibull Grading Test (WGT).
–  Errors associated with WGT.
–  Results of highly accelerated life testing (HALT).
–  Results of life step stress testing (LSST).
–  Voltage acceleration factors.
–  Voltage derating as a means to increase reliability of tantalum capacitors.