Wafer probe handles nodes 45 nm and below

The Elite 300 wafer probe offers 300-mm wafer probing accuracy and reliability for devices with process nodes at 45 nm and below. It is designed to solve the critical measurement challenges at each advancing technology node by incorporating state-of-the-art electrical and mechanical technology, advanced materials, and leading-edge measurement techniques.

The Elite 300 applications include RF/DC device characterization and modeling, wafer-level reliability, IC failure analysis, and design debug. (From $80,000 to $400,000 12 weeks ARO.)

Cascade Microtech , Beaverton , OR
Cali Sartor 503-601-1000

http://www.cascademicrotech.com