Low-cost software converts test patterns

Two software packages, TD-Scan and TD-Sim, convert test patterns from EDA system automatic test pattern generators for use with popular ATE systems. TD-Scan supports ATPG outputs from Cadence, Mentor Graphics, and Synopsys, translating scan patterns in WGL or STIL format to a target ATE program format.

TD-Scan can be upgraded to TD-Sim, which translate both formats mentioned above plus functional patterns from logic simulators in VCD or EVCD event file format. Various filters are also available for event files requiring conditioning before cyclization. (TD-Scan, from $5,000/yr; TDSim, from $15,000/yravailable now by subscription.)

Test Systems Strategies , Beaverton , OR
Information 503-466-4949

http://www.tessi.com